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Eprom 2: 7078A
The unit was removed from a working system but the upper section was separated from the base and is now missing five of the retention screws (see photos)
POST NP8148C015-3 1
img{max-width:100%} Varian Semiconductor Equipment E15002180 PREDEP Communications Expander PCB New
JEOL Column Pneumatic Sample Gate JWS-7555S Wafer Defect Review SEM Working Eprom 2: 7078AJEOL Column Pneumatic Sample Gate JWS 7555S Wafer Defect Review SEM Working Inventory # CONF 1329 Part No: Pneumatic Sample Gate Removed from a JEOL JWS 7555S Wafer Defect Review SEM Scanning Electron Microscope System This JEOL Column Pneumatic Sample Gate JWS 7555S Wafer Defect Review SEM Working is used working surplus. Removed from a JEOL JWS 7555S Wafer Defect Review SEM Scanning Electron Microscope System. The physical condition is good, but
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